A dynamic over-sampling procedure based on sensitivity for multi-class problems

Áreas de investigación:

• Methodology - Machine learning

Año:

2011

Tipo de publicación:

Artículo

Autores:

• Fernandez-Navarro, Francisco
• Hervás-Martínez, César
• Gutiérrez, Pedro Antonio

Journal:

Pattern Recognition

Volumen:

44

Páginas:

1821–1833

BibTex:

@article{FFernandez2011, author = "Francisco Fernandez-Navarro and C{\'e}sar Herv{\'a}s-Mart{\'i}nez and Pedro Antonio Guti{\'e}rrez", awards = "JCR (2011): 2.292 (category ENGINEERING, ELECTRICAL {\&}amp; ELECTRONIC, position 35/245 Q1)", comments = "JCR (2011): 2.292 (category ENGINEERING, ELECTRICAL {\&}amp; ELECTRONIC, position 35/245 Q1)", doi = "10.1016/j.patcog.2011.02.019", journal = "Pattern Recognition", note = "JCR (2011): 2.292 (category ENGINEERING, ELECTRICAL {\&}amp; ELECTRONIC, position 35/245 Q1)", pages = "1821–1833", title = "{A} dynamic over-sampling procedure based on sensitivity for multi-class problems", url = "http://dx.doi.org/10.1016/j.patcog.2011.02.019", volume = "44", year = "2011", }

Nota:

JCR (2011): 2.292 (category ENGINEERING, ELECTRICAL & ELECTRONIC, position 35/245 Q1)

Comentarios:

JCR (2011): 2.292 (category ENGINEERING, ELECTRICAL & ELECTRONIC, position 35/245 Q1)